Showing results: 3676 - 3690 of 4427 items found.
-
M8070ADVB -
Keysight Technologies
The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
-
Sciencescope International
Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.
-
K-1000 Series -
Kongter Test & Measurement Co., Limited
Load bank testing is vital to replicate and verify the operation of critical backup power systems such as diesel generators and uninterruptible power supplies (UPS). Kongter offers a wide range of customer-tailored AC load banks that excel in a range of load test applications and environments.
-
40-618-001 -
Pickering Interfaces Ltd.
The 40-618 PXI Source Switching Module consists of 12 separate 4-channel multiplexers and 44 uncommitted SPST relay contacts in a single width PXI module. Typical applications include signal routing for avionics test systems that conform to the ARINC 608A specification.
-
IMS-2001 -
Shanghai Jiuzhi Electric Co., Ltd.
IMS-2001 is made for high voltage testing laboratory operating environment, serious consider EMC hardware design, the system especially considering the impulse test characteristics used in most polluted areas, and it meet the standard such as IEC61083, IEC60060, IEEE1122, GB/T16896.1, IEC61000 and etc.
-
DATS-solo -
Prosig Ltd
The DATS-solo is a pocket-sized, ultra portable, high quality, 24-bit data acquisition system. The fully integrated DATS software provides options for acoustic & vibration testing, rotating machinery analysis, NVH tests, hammer impact analysis, resonance testing and modal analysis.
-
LCN -
Bitrode, Inc.
Full featured test system for quality control and R&DLife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
-
BroadWave Technologies, Inc.
BroadWave designs and manufactures RF Detectors and other coaxial RF components that are ideally suited for test, verification and system integration. With frequency ranges of DC to 18 GHz, our components offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.
-
Applied Image, Inc.
Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.
-
National Technical Systems
TS is uniquely situated to help manufacturers in the development, testing and certification of the smart home/home automation products. We can test with a wide variety of other home automation products, using protocols such as ZigBee, Z-Wave, Wi-Fi, and Bluetooth to see how your product functions. We can perform RF performance and coexistence testing to help you evaluate issues that your customers may see in their own homes, and how you can address them. In addition, we also are able to assist multiple system operators (MSOs) in the roll-out of home automation and home security products to their customers. In addition, we are an authorized ZigBee certification lab, and have test tools specifically focused on validate ZigBee Home Automation, ZigBee Smart Energy, and ZigBee Remote Control profiled products. NTS has also developed an Installer Tool to assist MSOs and installers in the setup and configuration of home automation/home security products.
-
LSG-1200A -
Lisun Electronics Inc.
The compact goniophotometer of LSG-1200A is used to measure the luminous intensity distribution curve, intensity data, spread angle and other parameters for Chip LED, LED Module, LED Spotlight and all other light which beam angle is no more than 180 degree. • Meets the requirements of IEC, CIE and LM-79 standards • Measures beam angle automatically: staple half intensity angle as well as 1/4 intensity angle, 3/4 intensity angle and 1/10 intensity angle which meets the special requirements. • Measured data is matched with international standard form (IES) and can be applied for lighting design by other lighting design software such as DiaLux • LSG-1200A has included a dark room, measures the maximum size of lamps: 180mm • Test range of luminosity: 0.1～30,000lx. Test accuracy of detector: Class 1 • The distance between the tested lamp and detector is 316mm/1000mm • Angle interval: Horizontal angle: 1°/5°/10°/15°/22.5°/30°/45°/90°, Vertical angle: 0.5°/2°/1.5° • The LSG-1200A horizontal automatic rotating on 0°~360° and Vertical automatic rotating on -90°~+90° • Test accuracy of angle: ±0.2° Work with the follow instruments as a System
-
780319-02 -
NI
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
-
780319-03 -
NI
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
-
780319-01 -
NI
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
-
Vektrex Electronic Systems
The Vektrex Integrated Thermal Control System (ITCS) uses proprietary water-based thermal control to maintain consistent LED and laser device temperatures during high power testing applications. LED/VCSEL manufacturers and third-party test facilities standardize on ITCS chambers for their testing needs.
